- 可配置各種儀器控制和量測功能的 PC 軟體。
|利用 Keysight E4980A/AL 精密型 LCR 錶測試無線充電系統中的線圈 - 應用說明
本指南對 Keysight E4980A/AL 精密型 LCR 錶如何評估無線充電系統中最常用的元件 - 線圈進行了說明。
|Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.
|Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.
|MEMS On-wafer Evaluation in Mass Production - Application Note
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.
|Measurement of Capacitance Characteristics of Liquid Crystal Cell - Application Note
This short application note describes how to take best advantage of the 4284A's powerful features when measuring capacitance while varying an AC signal voltage applied tothe liquid crystal material under test.
|Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.
|Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.
|Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.
|Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.
|High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.
是德可協助您進行 MEMS/NEMS 裝置的特性分析。
|Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.
|Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.
|Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.
|Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.
|Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.